Suzhou Submission Form

1.  The Invention

 

Title: Instrument for measurement of thickness layers or coatings type KULOTESTER

The problem the inventor(s) wanted to solveVery fast measurement of the thickness superficial layer of nitrides in the nitrided layer lets on the control and steering of a nitriding atmosphere during nitriding process.
Description: In traditional metallurgical analysis, the thickness of layers is evaluated based on observation and measurements carried out on cross-sections. The KULOTESTER method of the ball-generated tapered section (spherical section) allows the measurement of thickness and an analysis of microstructure of thin layers, generated by diverse methods, among other by PVD, nitriding, etc.
Presentation.  POSTER
 Fields of application
: metallurgical analysis   measurement of the thickness of coatings and layers, analyses of structure.

Advantages: The KULOTESTER method of the ball-generated tapered section (spherical section) allows the measurement of thickness and an analysis of microstructure of thin layers, generated by diverse methods, among other by PVD, nitriding, etc. Based on the analysis of the wear trace generated, it is possible to assess the thickness of the layer, as well as to carry out an initial structural and tribological evaluation.

Stage of development. pre-production prototype,
 
Documentation available:  () No   ( ) Yes

2.  The inventor (or inventors)

 

Name(s): Marek BETIUK, Jerzy MICHALSKI, Piotr WACH, Kryspin BURDYNSKI, Aleksander NAKONIECZNY

Photo. none
Self introduction.

Owner of the invention?  ( ) No  ( ) Yes
Institute of Precision Mechanics, Warsaw, Poland

3.  Protection

 

Patent Status:
    -

Priority

4.  Business intention

 

Selling the new product

5.  Contact:

 

Institute of Precision Mechanics

Address: Duchnicka 3, 01-796 Warsaw, Poland

Tel +48 22 560 26 00     E-mail: info@imp.edu.pl                             www.imp.edu.pl