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1. The Invention |
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Title: Instrument
for measurement of thickness layers or coatings type KULOTESTER The problem the
inventor(s) wanted to solve – Very fast measurement of the thickness superficial
layer of nitrides in the nitrided layer lets on the
control and steering of a nitriding atmosphere
during nitriding process. Advantages: The KULOTESTER method of the ball-generated tapered section (spherical section) allows the measurement of thickness and an analysis of microstructure of thin layers, generated by diverse methods, among other by PVD, nitriding, etc. Based on the analysis of the wear trace generated, it is possible to assess the thickness of the layer, as well as to carry out an initial structural and tribological evaluation. Stage of
development. pre-production prototype, |
2. The
inventor (or inventors) |
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Name(s): Marek BETIUK, Jerzy MICHALSKI, Piotr WACH, Kryspin
BURDYNSKI, Aleksander NAKONIECZNY Photo. none Owner of the
invention?
( ) No ( ) Yes |
3.
Protection |
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Patent Status: |
4.
Business intention |
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Selling
the new product |
5.
Contact: |
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Institute
of Precision Mechanics
Address: Duchnicka
3, 01-796 Tel +48
22 560 26 00 E-mail: info@imp.edu.pl www.imp.edu.pl |