the |
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1. The Invention |
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Title:
Chained Neutron Fluence Detector Description: the
presented invention involves a SRAM (static random access memory) for neutron
detection using parasitic SEU (single event effect) effect |
2. The
inventor (or inventors) |
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Dariusz Makowski, Grzegorz Jabłoński, Mariusz Grecki, Andrzej
Napieralski, Stefan Simrock, Bhaskar Mukherjee
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3.
Protection |
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Patent Status: |
4.
Business intention |
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Selling the patent and licensing. |
5.
Contact |
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Name: Technical |